Analyses
Our ultra-thin, transparent layers are not visible to the naked eye. It is only by means of effective analytical instruments that one can characterize the outermost atomic layers. Wherever surfaces come into play, measurements and analyses can be carried out. To put it differently, wherever surfaces come into play, so do our services! We have a wide range of analytical instruments and the relevant expertise to conduct detailed investigations. Whether we are talking about its composition, layer thickness, energy or friction, we can shed light your product’s surface from a whole different perspective.
Take a look at our facilities and equipment, and you will see that we have no lack of instruments:
X-Ray Photoelectron Spectroscopy (XPS)
X-ray photoelectron spectroscopy (XPS) allows us to determine the chemical composition of the outermost layer of a surface. More…
Further surface-analytical instruments
To answer your questions accurately and expeditiously, we offer a unique combination of analytical methods.
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Analytical Method |
Area of application |
Measuring Environment |
Materials |
References |
|
ToF-SIMS: Time-of-Flight Secondary Ion Mass Spectroscopy |
Determination of the chemical composition, depth and lateral distribution in a layer |
Ultrahigh vacuum (UHV) |
No restrictions |
|
|
Variable Angle Spectral Ellipsometry (VASE) |
Measurement of the film thickness and the refractive index of a film |
in-situ/ambient |
reflektierend |
|
|
Micro-Tribometer (mTb) |
Determination of the frictional properties |
flüssig/ambient |
No restrictions |
|
|
Contact Angle (CA) and surface tension |
Determination of the wettability and the surface energy |
ambient |
No restrictions |
|
|
Scanning Electron Microscopy (SEM/EDX) |
Surface imaging down to the nanometer scale |
Ultrahigh vacuum (UHV) |
No restrictions |
|
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Interference Microscopy |
Surface imaging |
ambient |
No restrictions |
|
|
Atomic Force Microscopy (AFM) |
Imaging of the surface topography, roughness and friction |
ambient |
sehr flach |
|
|
Quarz Crystal Microbalance (QCM) |
Determination of adsorption processes and in situ reactions |
liquid |
Thin layers on sensor surface |
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Waveguide Interrogated Optical Sensors (WIOS) |
Determination of adsorption processes and in situ reactions |
liquid |
Thin layers on sensor surface |
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